OMX-SR

FPBASE

Optics

Objectives

  1. Plan ApoN 60x/1.42
  2. TIRF Apo 60x/1.49

Cameras and Emission Filters

3 x liquid cooled [pco.edge 5.5 sCMOS cameras]

Lasers

Sample holder compatibility

Interface Requirements

PC

Notes on usage:

SIM imaging is extremely sensitive to spherical aberration. To get the highest quality images you need to minimize spherical aberration. This means:

As a general rule, if the sample doesn't look good in widefield or confocal, SIM imaging will not improve it. You should make every attempt to optimize your staining and reduce background from out-of-focus fluorescence for the best results.

Effect of mounting media on sample:

mountingmedia-effect-on-sample mountingmedia-effect-on-sample

Oil Effect on beads:

OMX_PSF_oil_test_with_beads OMX_PSF_oil_test_with_beads

Documentation

Application Guides

📄 Oil Optimization Application Guide

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Quick Reference Guides

📄 DLM Acquisition Quick Reference

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📄 DLM Analysis Quick Reference

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📄 OMX-SR Acquisition Quick Reference

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📄 OMX-SR Reconstruction Quick Reference

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System Information

📄 OMX-SR System Information

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📄 OMX-SR E-Controller

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📄 Ultimate Focus

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📄 Ring TIRF

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Imaging Techniques

📄 Image Registration

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📄 Localization

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📄 PhotoKinetics

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📄 PhotoKinetics (PK)

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📄 FRAP Product Note

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SIM Artifacts & Troubleshooting

📄 Common SIM Artifacts (2016)

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Getting your Data off the OMX!